Fig. 3: Conductance measurements (1.5 K) of graphene QPCs patterned by AFM cleavage lithography with cuts running along zigzag directions. | npj 2D Materials and Applications

Fig. 3: Conductance measurements (1.5 K) of graphene QPCs patterned by AFM cleavage lithography with cuts running along zigzag directions.

From: Robust quantum point contact operation of narrow graphene constrictions patterned by AFM cleavage lithography

Fig. 3

(Upper insets: optical images of the devices. Lower insets: 3D topographic AFM image of the nanoconstrictions, scale bars are 100 nm.) a Two-probe conductance curve in zero magnetic field, for a ~75 nm wide constriction revealing conductance plateaus at integer n × e2/h values separated by 2 e2/h steps. b Two-probe conductance curve measured through a ~30 nm wide graphene constriction in 8 T magnetic field displaying quantization steps with e2/h spacing.

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