Fig. 2: Kelvin probe force microscopy characterization of a MoSe2 monolayer flake region. | npj 2D Materials and Applications

Fig. 2: Kelvin probe force microscopy characterization of a MoSe2 monolayer flake region.

From: Uncovering topographically hidden features in 2D MoSe2 with correlated potential and optical nanoprobes

Fig. 2

a Topography AFM image, b KPFM potential map with scale bars equal to 5 μm, c line scans of edge grain boundary (blue line in b) and bilayer (yellow line in b) with associated height scans, d KPFM phase map with scale bars equal to 5 μm, e height and KPFM potential of enhanced edge of new flake with scale bar equivalent to 1 μm, and f line scans of height and potential in e.

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