Fig. 2: Structural characterization of Fe5GeTe2 by X-ray diffraction.
From: Large-scale epitaxy of two-dimensional van der Waals room-temperature ferromagnet Fe5GeTe2
a Unit cell projected along [100], with FGT layers separated by the vdW gap between adjacent Te sublayers. The right-side image shows the same projection for several repetitions of the unit cell. The occupation probability is represented by half-filled solid balls. Images generated using VESTA software52 for the crystallographic model of ref. 7. b Out-of-plane θ/2θ XRD scan of the films, showing Al2O3(00 l) and Fe5GeTe2 (00 l) peaks. Inset: zoom on the (009) Bragg peak to show the fringes used to estimate the film thickness. c In-plane radial XRD scans along the (110) reciprocal direction (R), and (010), (R+30°). Each diffraction peak is labelled with the full widh at half maximum. d In-plane azimuthal XRD scan over the families {110} and {300} showing the 6-fold symmetry of the crystal. Gray lines show the corresponding radial peak.
