Fig. 4: Detailed characterization of mediator-grown WS2.
From: Mediator-assisted synthesis of WS2 with ultrahigh-optoelectronic performance at multi-wafer scale
a Optical micrograph of individual flake obtained after short growth duration. b Aberration corrected TEM image of lattice structure with indication of crystal orientation, (inset) cross-sectional trace of intensity. c False-color TEM image of single-crystalline flake, with corresponding SAED patterns at different locations indicating its single crystallinity. d Determining valence band edge through linear extrapolation of cubic root of photoelectron emission vs photon energy48, (inset) experimental band structure with Fermi level extracted from Kelvin-probe measurements.
