Fig. 4: TERS imaging for the localized edge region.
From: Investigating heterogeneous defects in single-crystalline WS2 via tip-enhanced Raman spectroscopy
a High-resolution TERS image for A1g peak area intensity. The white dashed line indicates the positions of the extracted TERS spectra in (c). b Peak distribution TERS image derived from (a). c TERS spectral line trace for D and A1g peaks. Each TERS spectrum was extracted at an interval of 10 nm. The black dashed line indicates the Raman shift of 417 cm−1. Plots of peak values and intensities for d D peak and e A1g peak, with respect to tip displacement. The error bars indicate the fitting error.
