Fig. 1: Experiment scheme and TRXD results.
From: Strong modulation of carrier effective mass in WTe2 via coherent lattice manipulation
a Scheme of the time-resolved X-ray diffraction experiment. b WTe2 crystal structure projected in the yz plane where the red rectangles delimit the orthorhombic unit cell; the atomic labels are used for discussion in the text. c Time-resolved modification of the diffraction intensity ΔI/I for the (075), \((\bar{1}46)\), \((\bar{1}62)\), and \((\bar{1}63)\) diffraction peaks, where the traces are shifted for visualization purposes, and d for the \((\bar{1}63)\) reflection using a tenfold shorter time step; in the latter panel, the fit model takes into account four oscillatory contributions (see text). In the graphs, the markers correspond to experimental data, while the continuous lines are the fit curves. e Fourier transform of panel d after subtracting the non-oscillatory response; the right part of the curve multiplied was by 3 to highlight the peaks indicated by the black arrows. The data were acquired at 3.2 mJ/cm2 absorbed fluence at T = 295 K. The error bars represent one standard deviation uncertainty.
