Fig. 3: Optical properties and guided light/InPSe interaction.

a Optical parameters (n and k) of the InPSe extracted from ellipsometry. The inset shows the PL mapping of the flake on Si-MRR. The scale bar is 4 µm. b Guided light-multilayer InPSe interaction: Electric-field profiles (|E|2) of TE mode of bare Si waveguide (top panel) and 30 nm InPSe on Si (bottom panel) at 1550 nm. c The transmission spectra of the MRR without (black) and with (red) the InPSe flake for the TE mode. d Electrical characteristics of the Si-MRR/InPSe device (30 nm) under dark and 532 nm light excitation. The inset shows the dark current of the Si-MRR/InPSe device.