Fig. 8: Non-volatile memory and stability test. | npj 2D Materials and Applications

Fig. 8: Non-volatile memory and stability test.

From: Simultaneous optical power insensitivity and non-volatile wavelength trimming using 2D In4/3P2Se6 integration in silicon photonics

Fig. 8

a A continuous test lasting 420 min using the set/read/hold function. The inset illustrates the schematic of the set/read/hold cycle function. b, c display the transmission spectra obtained during the read and hold functions, respectively, spanning from 5 min to 420 min. d The stability of the Si-MRR/InPSe device was evaluated over a continuous testing operation lasting 6 days. The device exhibited a non-volatile nature throughout the entire duration of the six-day test.

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