Extended Data Fig. 2: Time-resolved PL counts recorded under pulsed laser excitation.
From: Single artificial atoms in silicon emitting at telecom wavelengths
Histogram of the PL counts measured on a single defect under a 50-ps pulse laser excitation at 532 nm, with a periodicity of 270 ns. The measurement sequence was repeated 2.8 billion times. Counts are integrated in the window [0, 150] ns (shaded area), subtracted from noise counts (gray shaded area), and finally divided by the number of sweeps to get the probability to detect a photon per optical excitation Pphoton ≃ 4.1 ⋅ 10−4.
