Extended Data Fig. 3: The surface morphologies and analogical grazing incidence X-ray diffraction (GIXRD) spectra of samples grown under 0, 2, 6, and 9 T magnetic fields.
From: Topology-induced chiral photon emission from a large-scale meron lattice
a, Surface morphologies are characterized by AFM. All the samples displayed a flat surface except for some nanoscale pits. The size of these pits barely changed with the growth magnetic fields, while the depth and amount gradually decreased. b, The diffraction patterns illustrated two peaks at 44.42° and 64.30°, respectively. These two peak positions refer to the {110} and {200} planes of body-centred cubic Fe, respectively53.
