Extended Data Fig. 4: Compositional and structural characterizations of Pd/Fe/MgO trilayers on GaN wafers.
From: Topology-induced chiral photon emission from a large-scale meron lattice
a-b, Chemical and structural characterizations of the 0 T (a) and 9 T (b) samples. (I) Cross-sectional high angle annular dark-field (HAADF) scanning transmission electron microscope (TEM) images and the corresponding energy dispersive spectroscopy mappings. (II) Bright-field high-resolution TEM (HRTEM) images. (III) Inverse fast Fourier transform images and fast Fourier transform diffraction patterns of the Fe films, showing crystallinity in different zones, as marked by red and blue boxes in (II).
