High-throughput and non-destructive electroluminescence detection of microscale light-emitting diodes can be performed using flexible probe arrays that adaptively deform to match the surface morphology of the light-emitting diode wafer.
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Liao, X., Guo, Z. & Chen, Z. Testing microscale light-emitting diodes with a lighter touch. Nat Electron 8, 459–460 (2025). https://doi.org/10.1038/s41928-025-01403-4
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DOI: https://doi.org/10.1038/s41928-025-01403-4
