Fig. 3: AFM-IR characterization of the TSB-C12 underlayer.
From: Single polyoxometalate-based nanoclusters characterized by infrared absorption nanospectroscopy
AFM-IR images of the TSB/HOPG sample on (a) a flat area, (b) a thick area. Topographic images are on the left and IR images recorded at 1600 cm−1 are on the right; c compared spectra of the TSB powder (FTIR, bottom), the TSB/HOPG sample on a thick area (AFM-IR, average spectrum on 3 spectra, middle), the TSB/HOPG sample on a thin area (AFM-IR, average spectrum on 6 spectra, top). For the sake of clarity, the average AFM-IR spectra intensities were divided (by 10 for the thick layer, 5 for the monolayer). The AFM-IR spectra measured at several locations of the IR images are reported in the Supplementary Fig. 8.
