Fig. 3
From: Interfacial width and phase equilibrium in polymer-fullerene thin-films
Bilayer fit parameters for PS/PCBM bilayers annealed (ex-situ) at various temperatures for various times, as a function of the weight-average molecular weight (Mw) of the PS. a The (Gaussian) roughness of the buried (PS/PCBM) interfaces in annealed samples. Inset; the same data, but showing the lower Mw samples only, in conjunction with measurements on unannealed samples. b The SLD of the top layer in the samples before and after annealing, showing no systematic Mw-dependent behaviour. The data points at 344 kg mol−1 in a and b are from Môn et al.43 (in each plot three of these annealed data points are from samples that were heated for 10 min and the other for 60 min). The legend applies to the data points in both a and b
