Fig. 3: Temperature dependence of the cutoff.
From: Work function seen with sub-meV precision through laser photoemission
Photoelectron distributions recorded at the temperatures of 30 (a), 60 (b) and 90 K (c) on sample 2. The distributions are mapped in the plane spanned by the photoelectron energy (EPE − EF) and emission angle (θ), where EPE and EF are the photoelectron energy level and Fermi level, respectively. d Temperature dependence of the distribution curves across the slowest-end cutoff at θ = 0° and across the Fermi cutoff. ϕs is the work function of the sample. e The slow-side cutoffs at various temperatures. Inset shows the expanded view around the emission angle θ = 0°, in which one standard deviation σ of 0.4 meV for the values in [−0.5, 0.5°] is indicated by an error bar.
