Fig. 1: Materials characterizations of Al–sapphire interfaces.
From: Thermal conductance across harmonic-matched epitaxial Al-sapphire heterointerfaces
a X-ray diffraction (XRD) patterns of Sub100 on a log scale. b Phi scans (220) Al and (1123) Al2O3. c Atomic force microscopy (AFM) images of Al surface. The length scale bar on the image is 1.0 Root-mean-square (RMS) roughness for a 5 µm × 5 µm area are 0.125 nm for Sub200. The color represents surface roughness shown by the color bar (−1 to 1 nm). d High-resolution transmission electron microscopy (HRTEM) cross-section image of Al–sapphire interface: cross-plane [111] Al ||[0001] Al2O3 and in-plane [110] Al ||[1010] Al2O3. We see a sharp and distinct Al–sapphire interface. The length scale bar is 5 nm.
