Fig. 4: Charge identification, momentum-by-curvature and angular resolution, all with respect to the track length.

a Charge ID probability for muons and antimuons (μ^±) as a function of the track length projected on the plane perpendicular to the 0.5 T magnetic field. An equal number of particles and antiparticles are considered. The error is less than 6 × 10⁻³ for all data points (charge ID prob.). b Charge ID probability for electrons and positrons (e^±) as a function of the track length projected on the plane perpendicular to the 0.5 T magnetic field. An equal number of particles and antiparticles are considered. The error is less than 5 × 10⁻³ for all data points (charge ID prob.). c A muon example of 0.6 GeV/c with a 0.5 T magnetic field is considered to show the momentum-by-curvature resolution as a function of the track length projected on the plane perpendicular to the magnetic field. The average Euclidean distance (between true and fitted nodes) per muon particle was considered. d A muon example of 0.6 GeV/c with a 0.5 T magnetic field is considered to show the angular resolution as a function of the particle length in the detector. The average Euclidean distance (between true and fitted nodes) per muon particle was considered. The results in this figure are presented for the different fitting techniques: Transformer, recurrent neural network (RNN), and sequential importance resampling particle filter (SIR-PF) with all hits and only track hits as input.