Fig. 3: Nano-electronic and photonic vs. topographic profiles that show lithographic fingerprints of nano-gaps in junction fabrication.
From: Visualizing heterogeneous dipole fields by terahertz light coupling in individual nano-junctions
Line cuts of the near-field amplitude (red) and topography (gray) (a) along the direction from the upper wing to the lower wing across the center of the junction and (b) across the lower wire lead. c Cross-section high-angle annular dark-field STEM image of a Josephson junction and the corresponding EDS elemental mapping (d) that shows the disconnection of the upper wing to the center piece of the junction.
