Fig. 4: Wave localization in Yukawa-potential amorphous structures.

a Wavelength dependence of the scattering length for different T^*. The error bars are the standard deviation of the effective length corresponding to a given T^* and to a set of multiple realizations of disorder. b Number of modes at the normalized frequencies above but the nearby edge of the dielectric band (K-point), for T^* = 0.4. The inset shows the modal probes used during calculations. c Modified Ioffe-Regel factor vs. the shifted wave number, k^*. d Mean free path vs. localization length, determined for the modes in c. The dashed lines correspond to the wavelengths of the top edge of the dielectric band (λ = 1600 nm) and mid-gap (λ = 1460 nm).The insets of (c) and (d) show example modal distributions of the modes with the highest quality factor (localization) from T^* = 0.2 to T^* = 5.0. A full list of the selected modes is given in Supplementary Note 2, Table S1.