Fig. 2: Recorded diffraction images at different θ angles.
From: Dark-field X-ray microscopy with structured illumination for three-dimensional imaging
Measured intensity plot versus the angle of incidence θ is obtained by integrating the images collected at the corresponding angle. The images captured without the coded aperture are recorded by incrementally stepping θ in increments of 0.003°, with the detector positioned at the Bragg angle (2θ). Fitting a Gaussian function to the Bragg peak reveals a mean of 11.374° and a standard deviation of 0.0055°.
