Fig. 1: Scanning ultrafast electron microscopy (SUEM) difference images of α-RuCl3 taken at low optical fluences. | Communications Physics

Fig. 1: Scanning ultrafast electron microscopy (SUEM) difference images of α-RuCl3 taken at low optical fluences.

From: Anomalously slow hot carrier cooling and insulator-to-metal transition in a photo-doped Mott insulator

Fig. 1

a SUEM difference images taken as a function of delay time with an optical pump fluence of 30 μJ/cm2. The bright contrast indicates enhanced secondary electron yield in the photoexcited region. b Amplitude of the SUEM contrast (fitted to two-dimensional Gaussian functions) as a function of delay time with an optical pump fluence of 30 μJ/cm2, suggesting a photocarrier recombination lifetime of 2.2 ns. c Radius of the SUEM contrast (fitted to two-dimensional Gaussian functions; original radius r0 subtracted) as a function of delay time at optical fluences of 30 and 40 μJ/cm2. The theoretical model used to fit the data is explained in the Supplementary Note 1.

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