Fig. 3: The role of film thicknesses on Raman spectra.
From: Selective phase growth and precise-layer control in MoTe2
The correlation between the thickness of the thermally evaporated Mo film and the resulting few-layered MoTe2 on 300 nm SiO2/Si substrate. Errors are based on n = 6 independent points (a); 532 nm Raman spectra depending on number of layers in few-layered 2H-MoTe2 on 300 nm SiO2/Si substrates. The spectra are shifted along y-axis for clarity. The modes associated with 2H-MoTe2 are labelled and second-order peaks are marked with asterisk (b); Raman data assessment of B12g/E12g ratio for MoTe2 films on 300 nm SiO2/Si depending on the number of layers (blue triangles). The data (red circles) for exfoliated MoTe2 samples adopted from ref. 38. are plotted for comparison. Errors are based on n = 15 independent points (c); Raman data assessment of the positions of B12g and E12g peaks depending upon the number of layers. Errors are based on n = 15 independent points (d).
