Fig. 2: Out-of-plane and in-plane XRD measurements of chemically doped PBTTT thin films.
From: Supramolecular cocrystals built through redox-triggered ion intercalation in π-conjugated polymers
a Out-of-plane XRD measurements of chemically doped PBTTT thin films. The peak marked with an asterisk is attributed to aggregated F4TCNQ on the surface of the thin film. b In-plane XRD measurements of chemically doped PBTTT thin films. The peaks with the square markers are mainly attributed to the periodicity of the PBTTT backbone in the main chain direction, while the peaks with the triangle markers arise from the periodicity of π stacking of the PBTTT. c d-spacings extracted from XRD measurements, where dh00 corresponds to stacking of PBTTT sheet structures in the out-of-plane direction, d00l corresponds to the length of the repeating unit of the PBTTT backbone, and d0k0 corresponds to the π stacking distance in the in-plane direction. The error bars for the d-spacings were determined from uncertainties in the fitting and represent one standard deviation.
