Fig. 2: PSC characterization data.

a Measured short-circuit current densities, open circuit voltages, fill factors and PCEs for devices prepared using scaffolds containing different s-HAP contents. (centre line, average; box limit, standard deviation; whiskers, outliners). b J–V curves of best-performing devices. c EQE data measured for the devices. Bode (d) and Nyquist (e) plots for the impedance data. The circuit model used to fit the data is shown (see text).