Fig. 5: Polarization state characterization.
From: Deeply subwavelength mid-infrared phase retardation with α-MoO3 flakes
The polarization rotation angle ψ of the transmitted and reflected beam in each mode of operation are reconstructed in a transmission (flake thickness: 1.39 μm, silicon substrate) and c reflection (flake thickness: 0.92 μm, on Au). The ellipticity e for transmission and reflection is shown in b and d, respectively. The ribbon around the lines shows the standard deviation of the numerically fitted parameters (see Supplementary Figs. S8 and S9). The orange-shaded region shows the spectral range where the rotation ψ is close to 90∘.
