Fig. 4: Influence of electron acceleration voltage.
From: Locally controlled MOF growth on functionalized carbon nanotubes
a Normalized MOF area AMOF over the irradiation dose D at Vacc = 6 kV (dots) and b for Vacc = 30 kV (triangles). The higher the electron irradiation, the more suppressed the MOF growth. Solid lines are exponential fits of the form \({A}_{{{{{{{{\rm{MOF}}}}}}}}}/{A}_{{{{{{{{\rm{CNTmean}}}}}}}}}=A\cdot \exp (-D/g)\) with A6kV = 4, g6kV = 1785 μC cm−2, A30kV = 4.5, and g30kV = 5271 μC cm−2. The error bars denote the standard deviation calculated by the propagation of uncertainty using the individual standard deviations of AMOF and ACNTmean. c Schematic illustration of electron scattering within the substrate, with many electrons scattering near the surface (incident electrons colored in red and scattered electrons colored in blue). d Electron scattering for acceleration voltages higher (e.g., 30 kV) than in (c) (e.g., 6 kV). Electrons penetrate the substrate deeper and fewer electrons scatter near the surface, leading to less growth inhibition.
