Fig. 8: SEM micrograph of the fractured side surface of the L-DED, V = 3.3 mm/s sample, showing the effect of the secondary FCC phase on the crack propagation during deformation. | Communications Materials

Fig. 8: SEM micrograph of the fractured side surface of the L-DED, V = 3.3 mm/s sample, showing the effect of the secondary FCC phase on the crack propagation during deformation.

From: Crack mitigation in additively manufactured AlCrFe2Ni2 high-entropy alloys through engineering phase transformation pathway

Fig. 8

a Low-magnification image near the edge of the side surface. The white box indicates the region corresponding to the high-magnification image in b. b High-magnification image illustrates that crack propagation in the BCC/B2 is deflected and hindered once the crack encounters the dual-phase region of FCC and BCC/B2.

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