Fig. 1: Diffraction patterns obtained from the carbon film.

a Electron diffraction pattern from nm-sized fragments obtained from the single-crystalline film by the mechanical detachment (scratching) with a Cu grid. b–d X-ray diffraction maxima obtained from the film at different tilting angles Psi. Note that the (200)- and (222)-reflexes are forbidden for the diamond crystal lattice. The (111)- and (220)-reflexes exist for both phases; the peaks pointed by starlets and having significantly higher intensity correspond to the diamond substrate.