Fig. 3: Spectra measured for the fcc-carbon samples. | Communications Materials

Fig. 3: Spectra measured for the fcc-carbon samples.

From: Face-centered cubic carbon as a fourth basic carbon allotrope with properties of intrinsic semiconductors and ultra-wide bandgap

Fig. 3

a Raman spectrum obtained for mechanically detached fragments of the film located in a cell of a Cu grid; the dashed circle marks the area of analysis. b A comparison of Raman spectra obtained for the as-deposited epitaxial film on diamond substrate and the bare diamond substrate. Insets show the corresponding optical images. c Vacuum ultraviolet (VUV) reflection spectrum presented as measured for the film (inset) and as a Tauc-plot reconstructed on the basis of the Kubelka-Munk theory (see Methods). d X-ray photoelectron spectrum (XPS) obtained for the as-deposited carbon film after its fitting (the fitting procedure is described in Methods).

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