Fig. 5: Experimental and computed AF-axis orientations under various substrate-induced strains. | Communications Materials

Fig. 5: Experimental and computed AF-axis orientations under various substrate-induced strains.

From: Control of the antiferromagnetic domain configuration and Néel axis orientation with epitaxial strain

Fig. 5

Left Y-scale (square dots) and right Y-scale (solid-colored lines) stand respectively for the AF-axis tilts extracted from our various experimental heterostructures and defined from IP (//0°, i.e., parallel to sample surface) to OOP (//90°, i.e., perpendicular to sample surface), and the antiferromagnetic LFO energy states for different spins aligned along various orthorhombic axes, as a function of the average IP strain. Additional sketches obtained after structural optimization highlight that the AF-axis (yellow arrows) mostly lie in IP (OOP) for a compressive (tensile) strain inside the LFO orthorhombic cell (green, blue and red spheres for Lanthanum, Iron and Oxygen atoms, respectively).

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