Fig. 1: Schematics of monochromatic and pink-beam dark-field X-ray microscopy (pDFXM) setups.
From: 3D/4D imaging of complex and deformed microstructures with pink-beam dark field X-ray microscopy
a Monochromatic DFXM configuration, where a channel-cut monochromator (CCM) selects a highly monochromatic beam with an energy bandwidth of ΔE/E = 1.4 × 10−4 The diffracting grain of interest (GOI) is indicated in red. The objective lenses magnify the diffracted signal from the GOI. DFXM orientation maps are obtained by scanning two tilt angles (ϕ and χ) at a fixed scattering angle 2θ, revealing spatial variations in lattice orientation around the Qhkl scattering vector. b pDFXM configuration, where a double multilayer monochromator (DMM) selects a broader bandwidth bypassing the CCM. The increased bandwidth leads to a larger spread of the diffracted beam in the 2θ direction. A gas blower (shown in b) was used to perform in-situ annealing of a forged aluminum sample, leveraging the in-situ imaging capabilities of pDFXM to enable real-time monitoring of grain growth. The transition between monochromatic and pDFXM configurations is achieved in less than a minute by shifting a few motors with an 8 mm offset in the lab y direction, allowing seamless switching between the two modes.
