Fig. 2: DFXM intensity comparison using different beam configurations.
From: 3D/4D imaging of complex and deformed microstructures with pink-beam dark field X-ray microscopy
Raw intensity projections of an aluminum grain in a partially recrystallized sample, acquired using a a monochromatic beam, b a monochromatic beam with prefocusing via transfocator (2D compound refractive lenses, CRLs) placed between CCM and slits shown in Fig. 1, and c a pink beam without prefocusing. The images are presented on a logarithmic intensity scale, with relative intensities normalized to the monochromatic beam. The 27-fold intensity increase in (c) demonstrates the potential of pDFXM for improved signal collection and reduced acquisition times in 3D microstructure characterization using DFXM.
