Table 1 EoS comparison: EoS parameters obtained in the present and in previous experiments

From: In situ characterization of the phase diagram of Ir via X-ray diffraction coupled with resistive and laser-heated diamond anvil cell

V03)

K0 (GPa)

\({K}_{0}^{{\prime} }\)

α0 × 10−5 (K−1)

Model

Method

PTM

56.62(5)

327(2)

5.46(3)

1.87(8)

BM3+HP

AD-XRD

KCl+He

56.48(9)

360(5)

6.0(5)

1.6(2)

BM3+Ber

AD-XRD20

MgO

56.48

339(3)

5.3(1)

 

BM3

AD-XRD12

He

56.58

383(14)

3.1(8)

 

BM3

AD-XRD19

Ar

56.64(24)

341(19)

4.7(3)

 

BM3

AD-XRD14

Ne

56.69

306(23)

6.8(2)

 

BM3

ED-XRD10

MgO

56.614(13)

353(3)

5.03(9)

 

BM3

AD-XRD16

Bi

56

385

5.25

 

Vinet

DFT16

 

56.58

366

5

 

BM3

DFT13

 

56.17

377

5.3

 

Vinet

DFT20

 
  1. In the table, we are indicating the methodology used: AD and ED stand for angular or energy dispersive XRD; DFT: Density-functional theory. We are also indicating the PTM used in the experiments and the EoS model adopted: BM3: 3rd order Birch-Murnaghan; HP: Holland and Powell; Ber: Bermann equation. For the present experiment, we have indicated KCl+He because we have used previously reported data from12 for the ambient T part that were collected in He, while our data (collected in KCl) for the thermal part.