Fig. 2: Normal-shear mode coupling under the application of normal far-field stress. | Communications Engineering

Fig. 2: Normal-shear mode coupling under the application of normal far-field stress.

From: Active heterogeneous mode coupling in bi-level multi-physically architected metamaterials for temporal, on-demand and tunable programming

Fig. 2

Contour plots are presented for the induced strain of a regular honeycomb lattice (LR = 1 and θ = 30) as a function of the applied direct stress (σ) and piezoelectric voltage ratio (Vu/Vl). A and B Normal strain (ϵx) and its associated shear strain (\({\gamma }_{xy}^{C}\)) when normal far-field stress is applied along the X-direction. C Schematic visualization of (X-directional) normal and associated shear strain at lattice level. D and E Normal strain (ϵy) and its associated shear strain (\({\gamma }_{xy}^{ {{C}}}\)) when normal far-field stress is applied along the Y-direction. F Schematic visualization of (Y-directional) normal and associated shear strain at lattice level. Note that the white (in sub-figure A) and blued-dotted (in sub-figure D) regions represent the negative strain (compression) when tensile stress is given as input. The red-dotted (in sub-figures A and D) lines highlight the two different piezoelectric actuation modes i.e. pure-bending (Vu = Vl) and pure-axial (Vu = −Vl). The normal stress is given in N m−2 units.

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