Fig. 3: Normal-shear mode coupling under the application of far-field shear stress. | Communications Engineering

Fig. 3: Normal-shear mode coupling under the application of far-field shear stress.

From: Active heterogeneous mode coupling in bi-level multi-physically architected metamaterials for temporal, on-demand and tunable programming

Fig. 3

Contour plots are presented for induced in-plane shear strain and coupled normal strains in a regular honeycomb lattice (LR = 1 and θ = 30) as the function of applied shear stress (τxy) and the piezoelectric voltage ratio (Vu/Vl). A Variation of shear strain (γxy) when the far-field shear stress is applied in an anti-clockwise direction. B, C Coupled normal strain (ϵC) along X and Y-direction of the lattice, when a far-field shear stress is applied. D Schematic visualization of in-plane shear and associated normal strains under the application of far-field shear stress. Note that in sub-figure A, the white-dotted line represents the zero-shear strain line (γxy = 0), while the red-dotted lines highlight two different piezoelectric actuation modes i.e. pure-bending (Vu = Vl) and pure-axial (Vu = −Vl). The shear stress is given in N m−2 units.

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