Fig. 4: Sensitivity of cell wall architecture and external stimuli (applied voltage, Vu) on mode coupling. | Communications Engineering

Fig. 4: Sensitivity of cell wall architecture and external stimuli (applied voltage, Vu) on mode coupling.

From: Active heterogeneous mode coupling in bi-level multi-physically architected metamaterials for temporal, on-demand and tunable programming

Fig. 4

A Variation of coupling ratio as a function of voltage applied under X-directional loading for different piezo thicknesses. B Variation of coupling ratio as a function of voltage applied under Y-directional loading for different piezo thicknesses. C Variation of coupling ratios as a function of voltage applied under shear loading for different piezo thicknesses. Note that in the above three cases, a constant stress (σ, τ) of 1000 Pa and a hybrid-voltage-ratio of 2 is maintained throughout the lattice. The red arrows here in sub-figures A–C denote an increase in piezo thicknesses. The general slope of the curves in sub-figures A–C indicates the sensitivity of piezo thickness. D Voltage sensitivity of Young’s moduli. For comparing it with the honeycomb lattice proposed by Singh el al.39, equal voltage (Vu = Vl = V) is applied on both the piezoelectric layers in the present lattice at constant stress (σ = 10 Pa). E Voltage sensitivity of shear modulus in the present lattice at constant shear stress, τxy = 10 Pa. F Voltage sensitivities of Poisson’s ratios at constant stress (σ = 10 Pa). The above results are presented considering LR = 1, θ = 30. The voltage sensitivities for elastic moduli are given in N m−2 V−1, while those for Poisson’s ratios are given in V−1.

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