Fig. 1: MnTe structure, crystallographic and magnetic properties of the thin film as well as device geometry.

a Depiction of the crystal and easy axis configuration of the α-MnTe structure. b X-ray diffraction pole figure measurement of the MnTe \(1\bar{1}02\) Bragg diffraction shown in stereo-graphic projection. Red circles mark the expected diffraction positions of single crystalline MnTe. c SQUID magnetometry data of the MnTe/InP sample for in-plane magnetic field at T = 50 K. To emphasize the lack of residual magnetization, we subtracted a linear slope near zero magnetic field from the data shown in the inset. It is important to note that the subtracted slope encompasses both the susceptibility of MnTe and the diamagnetic substrate as detailed in the methods section. The dashed lines indicate the spin-flop field of ~3 T. d Microscopy image of a lithographically processed Hall bar as well as a sketch of the employed electrical schematic, coordinate system and definition of the magnetic field geometry for angle-dependent resistivity measurements.