Fig. 3: Quantitative phase imaging of a microlens array to validate the phase retrieval accuracy.
From: Quantitative phase imaging with a compact meta-microscope
a In-focus image of the microlens array surface captured by the metalens at λ0 = 450 nm. The imaging magnification is set as 4. b Defocused images captured by the metalens with illumination wavelengths from 420 to 480 nm. c Reconstructed in-focus phase profile of the microlens array. d Enlarged red-dashed box region of one microlens and AFM image of one microlens. The radial averages of the respective surface profiles and the profile difference curve are depicted below. e, f Comparison between the simulated and the experimentally measured transverse intensity distributions of the optical field transmitted through the microlens array with a distance of 100–500 μm with a 100-μm-interval. The imaging magnification of the field measurement system was adjusted to be approximately the same as the reconstructed field. Scale bars in a, c, and e, f are 20 μm.
