Fig. 4: The frequency distributions (FD) of the tOFF’ and tRON indicators, reflecting the passivation evolution during ECM and LECM. | npj Advanced Manufacturing

Fig. 4: The frequency distributions (FD) of the tOFF’ and tRON indicators, reflecting the passivation evolution during ECM and LECM.

From: Operando evaluation of passivation phenomenon during ECM/Laser-ECM: direct and on-machine evidence of passivation evolution

Fig. 4

a–e For the rolled samples, the range of tRON and frequencies of tOFF’ and tRON reduce with increasing voltage up to 30 V and with LECM due to improvement in passivation weakening. f–j The SLMed samples FDs follow a similar trend but exhibit lower tRON mode values due to the more EC-dissolution resistant microstructure.

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