Figure 4
From: Active dielectric antenna on chip for spatial light modulation
Measured normal-incidence transmission and reflection spectra of the SLMs with different perturbation strengths Δw.
(a) The transmission spectra. (b) The reflection spectrum. In both panels, the symbols are the measured data with Δw = 0 nm (black dots), Δw = 2 nm (red circles) and Δw = 4 nm (blue dimonds). The solid lines are the fitted spectra using the theoretical model with Δw = 2 nm (red line) and Δw = 4 nm (blue line). The spectra are normalized to the transmission and reflection when the optical beam passes through a featureless area of the chip. The featureless area has a transmission of ~50% compared to air (i.e. when the chip is completely removed from the setup), which is mainly due to the reflection from the silicon substrate and optical scattering at the unpolished backside of the chip.
