Figure 6
From: Active dielectric antenna on chip for spatial light modulation
Measured normal-incidence transmission (a) and reflection (b) spectra of the SLM with a perturbation of Δw = 2 nm under different bias voltages VDC.
Blue line: VDC = 0.7 V; green line: VDC = 1.0 V; red line: VDC = 1.1 V. The solid lines are measured when the E-field of the normal-incidence light is parallel to the silicon slabs (x-polarized). The dashed black line is measured when the E-field is perpendicular to the silicon slabs (y-polarized). The spectra are normalized to the transmission and reflection when the optical beam passes through a featureless area of the chip.
