Figure 8
From: Phase Transformation and Intense 2.7 μm Emission from Er3+ Doped YF3/YOF Submicron-crystals
(a) HR-TEM image and (b) SAED pattern of the YOF: Er3+ submicron-crystals and the scale bar is 2 nm and 2 1/nm, respectively. (c) EDS spectrum of the YOF: Er3+ submicron-crystals. The presence of the Si peak results from the silicon wafer used to pick up the sample in the course of EDS measurement.
