Figure 8
From: Metal/dielectric/metal sandwich film for broadband reflection reduction
Left: Two optical images of a silicon wafer either uncoated or coated with the SWF.The uncoated wafer is brightly reflective in contrast with the coated wafer. Right: Measured spectra of the average reflectance R = (Rp + Rs)/2 and the average absorbance A = 1 − R of the SWF-coated silicon wafer for θ = 5°. The inset shows the magnified spectrum of R.
