Figure 1
From: A novel nanometric DNA thin film as a sensor for alpha radiation
The alpha particle (241Am) radiation effect on the double crossover lattice (DXL) thin films.
(a) Schematic diagram illustrating the alpha particle (241Am) radiation effect on fully covered DXL film on glass substrate. (b – d) AFM images of DXL without and with irradiation. The scan size for all the AFM images are 3 μm × 3 μm unless otherwise noted; (b) without radiation exposure and the insets in top right corner is noise-filtered 2D spectrum image by noise filtered Fourier transform showing the periodicity of the crystals, the scan size is 50 nm × 50 nm. (c) Following radiation exposure from 241Am on DXL film with an exposure distance d = 1 cm and exposure time texp = 10 min. and (d) for d = 2 cm and texp = 20 min.
