Figure 1
From: Visualizing size-dependent deformation mechanism transition in Sn
Compression test of Sn pillars with diameter larger than 450 nm.
(a) Engineering stress-strain curves from the compression tests, with average strain rate of ~5 × 10−3/s. (b) and (c) are TEM bright field images of the pillar before and after its collapse, representing the moments marked in the stress-strain curve for the sample with diameter of 450 nm (black curve). (d) Post-mortem scanning electron microscopy (SEM) image of the 450 nm pillar showing the slip step.
