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Figure 1

From: Oxypnictide SmFeAs(O,F) superconductor: a candidate for high–field magnet applications

Figure 1

Microstructural analyses by TEM.

(a) Cross-sectional scanning TEM image of the SmFeAs(O,F) thin film. A crystallographically disordered layer as indicated by the arrows is present between Sm(O,F) cap and SmFeAs(O,F) layers. (b) Elemental Fe and (c) F mappings measured by energy dispersive x-ray spectroscopy. (d) High-resolution TEM image of the SmFeAs(O,F) thin film in the vicinity of the CaF2 substrate/SmFeAs(O,F) film interface.

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