Figure 1

Transmission electron microscopy (TEM) analysis (a) A bright-field (BF) TEM image and an electron diffraction (ED) pattern obtained from an as-synthesized PrBa0.5Sr0.5Co2-xFexO5+δ sample. (b) A high-resolution TEM image of a grain in (a). (c) A BF-TEM image and an ED pattern of the sample annealed at 700°C for 600 hours. (d) A high-resolution TEM image of a grain after annealing.