Figure 3: (a)–(c) are cross sectional-TEM images showing the epitaxial behavior and (d)–(f) are the interface structures for the BSTO films grown on 1°, 3°, and 5° miscut substrate surfaces, respectively. | Scientific Reports

Figure 3: (a)–(c) are cross sectional-TEM images showing the epitaxial behavior and (d)–(f) are the interface structures for the BSTO films grown on 1°, 3°, and 5° miscut substrate surfaces, respectively.

From: The Origin of Local Strain in Highly Epitaxial Oxide Thin Films

Figure 3

Edge dislocation distributions for the BSTO films grown on 1° and 5° (d and f) are periodic, but it is quasi-periodical on 3° (e)30. The inset of (a–c) is selection area of electron diffraction patterns (SAED) of the films taken along the [100] zone of the MgO lattice.

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