Figure 5
From: Solution processed molecular floating gate for flexible flash memories
(a) Transfer curve (IDS − VGS) of the F16CuPc memory at ON and OFF state on log scale. (b) Transfer curve (|IDS|1/2 − VGS) of the F16CuPc memory at ON and OFF state on linear scale. (c) Test pulse sequence for the endurance test. (d) Endurance characteristics of the F16CuPc device with respect to the number of bias operations. (e)Test pulse sequence for the retention test. (f) Data retention capability with respect to the elapsed time.
