Figure 3
P3HT nanowires probed by SPP-EFM.
(a) Height [nm]. (b) Goodness of fit R2. (c) Deconvolved channel proportional to the second derivative of the tip-sample capacitance A = (Q/2K)∂2C/∂z2 [°V−2]. (d) Deconvolved channel corresponding to the tip-sample contact potential difference VCPD [V].
